Ferroelectric properties of intergrowth Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] ceramics

Noguchi, Yuji; Miyayama, Masaru; Kudo, Tetsuichi
November 2000
Applied Physics Letters;11/27/2000, Vol. 77 Issue 22
Academic Journal
Ferroelectric intergrowth Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] has been demonstrated to have a large remanent polarization (2P[sub r]) of 30 μC/cm2 and a high Curie temperature of 610 °C using bulk ceramics. The Rietveld analysis of the powder x-ray diffraction patterns showed that there are two kinds of Bi ions in Bi[sub 2]O[sub 2] layers. One Bi ion in the Bi[sub 2]O[sub 2] layers was displaced to the other Bi ion along the polarization direction by about 2% of parameter a, which would contribute to the large 2P[sub r]. © 2000 American Institute of Physics.


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