TITLE

Ferroelectric properties of intergrowth Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] ceramics

AUTHOR(S)
Noguchi, Yuji; Miyayama, Masaru; Kudo, Tetsuichi
PUB. DATE
November 2000
SOURCE
Applied Physics Letters;11/27/2000, Vol. 77 Issue 22
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Ferroelectric intergrowth Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] has been demonstrated to have a large remanent polarization (2P[sub r]) of 30 μC/cm2 and a high Curie temperature of 610 °C using bulk ceramics. The Rietveld analysis of the powder x-ray diffraction patterns showed that there are two kinds of Bi ions in Bi[sub 2]O[sub 2] layers. One Bi ion in the Bi[sub 2]O[sub 2] layers was displaced to the other Bi ion along the polarization direction by about 2% of parameter a, which would contribute to the large 2P[sub r]. © 2000 American Institute of Physics.
ACCESSION #
4415054

 

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