Demonstration of near-field scanning photoreflectance spectroscopy

Paulson, Charles; Ellis, A. B.; Ellis, A.B.; McCaughan, Leon; Hawkins, Brian; Sun, Jingxi; Jingxi Sun; Kuech, T. F.; Kuech, T.F.
September 2000
Applied Physics Letters;9/25/2000, Vol. 77 Issue 13
Academic Journal
A near-field scanning optical microscope (NSOM) was developed to perform photoreflectance (PR) spectroscopy experiments at high spatial resolution (∼1 μm). Representative PR spectra are shown, along with an image illustrating the capability of observing contrast in images due to the strength of a PR feature. It was found that sufficiently high intensity light from the NSOM tip can produce photovoltages large enough to limit the spatial resolution of the electric field determination by PR. The photovoltage effect is measured as a function of light intensity, and the results are discussed in terms of a simple photovoltage expression. © 2000 American Institute of Physics.


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