Local capacitance measurements on InAs dot-covered GaAs surfaces by scanning capacitance microscopy

Yamamoto, H.; Takahashi, T.; Kamiya, I.
September 2000
Applied Physics Letters;9/25/2000, Vol. 77 Issue 13
Academic Journal
Capacitance images responsible for surface depletion were observed on an InAs dot-covered GaAs surface by scanning capacitance microscopy. We performed local capacitance versus bias voltage measurements on quantum dots (QDs) and a wetting layer (WL) as well as conductance versus bias voltage (G-V) measurements. Both results indicate that the surface depletion is more suppressed beneath the QDs than under the WL. In addition, the conventional thermionic equation theory fitted to the measured G-V curves shows that the interface barrier height between the GaAs and the InAs QD increases as the QD size is reduced. We ascribe this result to the influence of the surrounding WL, whose surface Fermi level is strongly pinned at the midgap of the n-GaAs. © 2000 American Institute of Physics.


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