Fast-scanning shear-force microscopy using a high-frequency dithering probe

Seo, Yongho; Yongho Seo; Park, June H.; Moon, Jin B.; Jhe, Wonho; Wonho Jhe
December 2000
Applied Physics Letters;12/25/2000, Vol. 77 Issue 26
Academic Journal
We have demonstrated high-speed scanning shear-force microscopy using a fiber tip attached to quartz crystal vibrating at 2.0 MHz resonance frequency. With a high-frequency dithering probe, we have obtained clear images at the scanning speed of 1.2 mm/s and it takes only 0.5 s to image the surface area of 55 μm2 for 64x64 pixels without any compromise of spatial lateral resolution. This speed is more than five times faster than that obtained by other topographic imaging methods and can be further improved to realize real-time shear-force probe microscopy. © 2000 American Institute of Physics.


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