TITLE

Reduction of threading defects in GaN grown on vicinal SiC(0001) by molecular-beam epitaxy

AUTHOR(S)
Xie, M. H.; Xie, M.H.; Zheng, L. X.; Zheng, L.X.; Cheung, S. H.; Cheung, S.H.; Ng, Y. F.; Ng, Y.F.; Wu, Huasheng; Huasheng Wu; Tong, S. Y.; Tong, S.Y.; Ohtani, N.
PUB. DATE
August 2000
SOURCE
Applied Physics Letters;8/21/2000, Vol. 77 Issue 8
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We observe a significant reduction of threading dislocations in GaN grown on vicinal substrates of SiC(0001). Using scanning tunneling microscopy, we find films grown on vicinal substrates maintain the surface misorientation of the substrate and display terraces with straight edges. On top of the terraces there is no spiral mound, which is the main feature found for films grown on singular substrates. Transmission electron microscopy studies confirm that threading screw dislocations are reduced by two orders of magnitude while edge dislocations are reduced by one order. © 2000 American Institute of Physics.
ACCESSION #
4414514

 

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