Microstructure and dielectric properties of Ba[sub 1-x]Sr[sub x]TiO[sub 3] films grown on LaAlO[sub 3] substrates

Gim, Y.; Hudson, T.; Fan, Y.; Kwon, C.; Findikoglu, A. T.; Findikoglu, A.T.; Gibbons, B. J.; Gibbons, B.J.; Park, B. H.; Park, B.H.; Jia, Q. X.; Jia, Q.X.
August 2000
Applied Physics Letters;8/21/2000, Vol. 77 Issue 8
Academic Journal
We report a systematic study of the microstructure and dielectric properties of barium strontium titanate, Ba[sub 1-x]Sr[sub x]TiO[sub 3], films grown by laser ablation on LaAlO[sub 3] substrates, where x=0.1-0.9 at an interval of 0.1. X-ray diffraction analysis shows that when x<0.4, the longest unit-cell axis is parallel to the plane of the substrate but perpendicular as x approaches 1. Dielectric constant versus temperature measurements show that the relative dielectric constant has a maximum value and that the peak temperatures corresponding to the maximum relative dielectric constant are about 70 °C higher when x≤0.4 but similar when x>0.4, compared with the peak temperatures of the bulk Ba[sub 1-x]Sr[sub x]TiO[sub 3]. At room temperature, the dielectric constant and tunability are relatively high when x≤0.4 but start to decrease rapidly as x increases. © 2000 American Institute of Physics.


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