TITLE

Experimental evidence of Si-H bond energy variation at SiO[sub 2]-Si interface

AUTHOR(S)
Cheng, Kangguo; Kangguo Cheng; Lee, Jinju; Jinju Lee; Lyding, Joseph W.
PUB. DATE
November 2000
SOURCE
Applied Physics Letters;11/20/2000, Vol. 77 Issue 21
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The threshold energy barrier for hydrogen desorption from the SiO[sub 2]-Si interface has been assumed to be the Si-H bond energy with the value of 3.6 eV. Based on the uniform Si-H bond energy and diffusion-limited degradation, the time-dependent hot-carrier degradation of metal-oxide-semiconductor (MOS) devices has been described by the so-called power law. In this letter, by investigating the degradation of submicron n-channel MOS devices at various stress conditions and over a large time scale (0.01-10000 s), we present experimental evidence that contradicts the uniform bond energy theory and supports the bond energy variation theory proposed recently by Hess and co-workers [Appl. Phys. Lett. 75, 3147 (1999); Physica B 272, 527 (1999)]. We find that, instead of a constant power factor of n=0.5 predicted by the uniform bond/diffusion-limited energy theory, n varies from ∼0.8 at the initial stress stage to ∼0.2 at the final stress stage consistent with the bond energy variation theory. © 2000 American Institute of Physics.
ACCESSION #
4414445

 

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