Dependence of critical current on field angle in off-c-axis grown Bi[sub 2]Sr[sub 2]CaCu[sub 2]O[sub 8] film

Durrell, J. H.; Gibson, G.; Barber, Z. H.; Evetts, J. E.; Ro¨ssler, R.; Pedarnig, J. D.; Ba¨uerle, D.
September 2000
Applied Physics Letters;9/11/2000, Vol. 77 Issue 11
Academic Journal
Critical current measurements for varying angles of applied field have been performed on Bi[sub 2]Sr[sub 2]CaCu[sub 2]O[sub 8] thin films grown on 10° vicinal (001) substrates. Measurements were performed on current tracks orientated both parallel (L) and transverse (T) to the vicinal steps. No Josephson vortex channeling effect was observed, in contrast to results previously obtained on both oxygenated and deoxygenated YBa[sub 2]Cu[sub 3]O[sub 7-δ] films grown on vicinal substrates. In addition, no force-free peak was observed when the applied field was parallel to the current. This provides experimental evidence that there is a difference between the pancake coupling mechanism in YBa[sub 2]Cu[sub 3]O[sub 7-δ] at small field angles where Josephson vortices are present and that in Bi[sub 2]Sr[sub 2]CaCu[sub 2]O[sub 8]. © 2000 American Institute of Physics.


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