TITLE

Edge-pinned states in patterned submicron NiFeCo structures

AUTHOR(S)
Shi, Jing; Jing Shi; Tehrani, S.
PUB. DATE
September 2000
SOURCE
Applied Physics Letters;9/11/2000, Vol. 77 Issue 11
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Magnetization reversal in patterned submicron NiFeCo structures has been studied. Application of a transverse field lowers the easy axis switching threshold of the center of the structures but the edge magnetization remains pinned along the initial direction until a higher reversal field is applied. Complete switching between the two stable magnetization states occurs only after depinning and reversal of the edge magnetization. The edge depinning field is found to be very insensitive to the transverse field strength. Micromagnetic simulations are used to characterize the magnetization reversal process. © 2000 American Institute of Physics.
ACCESSION #
4413698

 

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