Edge-pinned states in patterned submicron NiFeCo structures

Shi, Jing; Jing Shi; Tehrani, S.
September 2000
Applied Physics Letters;9/11/2000, Vol. 77 Issue 11
Academic Journal
Magnetization reversal in patterned submicron NiFeCo structures has been studied. Application of a transverse field lowers the easy axis switching threshold of the center of the structures but the edge magnetization remains pinned along the initial direction until a higher reversal field is applied. Complete switching between the two stable magnetization states occurs only after depinning and reversal of the edge magnetization. The edge depinning field is found to be very insensitive to the transverse field strength. Micromagnetic simulations are used to characterize the magnetization reversal process. © 2000 American Institute of Physics.


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