X-ray and optical characterization of multilayer AlGaAs waveguides

Leo, G.; Caldarella, C.; Masini, G.; De Rossi, A.; Assanto, G.; Durand, O.; Calligaro, M.; Marcadet, X.; Berger, V.
December 2000
Applied Physics Letters;12/11/2000, Vol. 77 Issue 24
Academic Journal
Effective-index measurements in multilayer AlGaAs waveguides are used in conjunction with x-ray reflectometry to yield refractive indices and thicknesses of the constituent layers, with the accuracy required by parametric interactions in guided-wave and photonic-band-gap structures. © 2000 American Institute of Physics.


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