TITLE

Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope

AUTHOR(S)
Pressler, H.; Ohkubo, M.; Koike, M.; Ukibe, M.; Zama, T.; Nakamura, T.; Katagiri, M.
PUB. DATE
December 2000
SOURCE
Applied Physics Letters;12/11/2000, Vol. 77 Issue 24
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Imaging diagnosis of superconducting tunnel junction x-ray detectors has been performed by an apparatus called the low-temperature scanning synchrotron microscope (LTSSM) using an x-ray microbeam with a diameter of 5-10 μm originated from synchrotron radiation. Quasiparallel intense synchrotron radiation enables one to obtain the full two-dimensional images of junctions with dimensions of 200x200 μm2 in about 1 h. The LTSSM results indicate that the standard quasiparticle diffusion and edge loss model for the spatial distribution of the junction response to x rays is evidently inadequate for intermediate or large junctions (with respect to a Josephson penetration depth). On this basis, it is argued that the models proposed for the signal creation and loss mechanism should be reconsidered. © 2000 American Institute of Physics.
ACCESSION #
4413625

 

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