Scanning second-harmonic/third-harmonic generation microscopy of gallium nitride

Sun, Chi-Kuang; Chi-Kuang Sun; Chu, Shih-Wei; Shih-Wei Chu; Tai, Shi-Peng; Shi-Peng Tai; Keller, Stacia; Mishra, Umesh K.; DenBaars, Steven P.
October 2000
Applied Physics Letters;10/9/2000, Vol. 77 Issue 15
Academic Journal
Scanning second-harmonic generation and third-harmonic generation microscopy of a gallium nitride (GaN) sample was demonstrated using a femtosecond Cr:forsterite laser. Taking advantage of the electric-field enhanced second-harmonic generation effect and bandtail state resonance effect, the obtained second-harmonic and third-harmonic generation microscopic images revealed the piezoelectric field and bandtail state distributions in a GaN sample. © 2000 American Institute of Physics.


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