TITLE

Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

AUTHOR(S)
So¨nnichsen, C.; Geier, S.; Hecker, N. E.; von Plessen, G.; Feldmann, J.; Ditlbacher, H.; Lamprecht, B.; Krenn, J. R.; Aussenegg, F. R.; Chan, V. Z-H.; Spatz, J. P.; Mo¨ller, M.
PUB. DATE
November 2000
SOURCE
Applied Physics Letters;11/6/2000, Vol. 77 Issue 19
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have developed a simple, fast, and flexible technique to measure optical scattering spectra of individual metallic nanoparticles. The particles are placed in an evanescent field produced by total internal reflection of light from a halogen lamp in a glass prism. The light scattered by individual particles is collected using a conventional microscope and is spectrally analyzed by a nitrogen-cooled charge-coupled-device array coupled to a spectrometer. This technique is employed to measure the effect of particle diameter on the dephasing time of the particle plasmon resonance in gold nanoparticles. We also demonstrate the use of this technique for measurements in liquids, which is important for the potential application of particle plasmons in chemical or biological nanosensors. © 2000 American Institute of Physics.
ACCESSION #
4413270

 

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