Optical study of ZnSe[sub x]Te[sub 1-x] alloys using spectroscopic ellipsometry

Lee, Hosun; Hosun Lee; Kim, S. M.; Kim, S.M.; Seo, B. Y.; Seong, B.Y.; Seong, E. Z.; Choi, S.H.; Choi, S. H.; Lee, S.; Furdyna, J.K.; Furdyna, J. K.
November 2000
Applied Physics Letters;11/6/2000, Vol. 77 Issue 19
Academic Journal
We report pseudodielectric function data 〈ε〉=〈ε[sub 1]〉+i〈ε[sub 2]〉 of ZnSe[sub x]Te[sub 1-x] samples grown on GaAs substrates. The data were obtained from 1.5 to 6.5 eV using spectroscopic ellipsometry. Critical-point parameters were obtained by fitting model line shapes to numerically calculated second-energy derivatives of 〈ε〉. The bowing parameters of E[sub 0], E[sub 1], and E[sub 1]+Δ[sub 1] were determined and were comparable to that of E[sub 0] quoted from the literature. We observed a monotonic increase of the linewidth of the E[sub 1] gap up to x=0.85, whereas that of E[sub 1]+Δ[sub 1] showed a maximum value near x=0.5. We attribute this anomalous broadening of the E[sub 1] gap to sample microstructures developed in the low-Te composition alloys. © 2000 American Institute of Physics.


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