Lorentz transmission electron microscopy of focused ion beam patterned magnetic antidot arrays

Toporov, A. Yu.; Langford, R. M.; Langford, R.M.; Petford-Long, A. K.; Petford-Long, A.K.
November 2000
Applied Physics Letters;11/6/2000, Vol. 77 Issue 19
Academic Journal
A focused-ion beam has been used to pattern magnetic antidot arrays containing different sized antidots and spacings in Ni[sub 80]Fe[sub 20] films. Their magnetic domain structure has been studied using Lorentz transmission electron microscopy, which has shown that the edges of the antidots pin the domain walls during magnetization reversal. The remanent domain structure was found to depend strongly on the antidot size and spacing, from domains pinned between the corners of adjacent rows of antidots for large sizes to domains pinned between the edges of adjacent antidots for small sizes. The relevance of such structures for high density recording is discussed. © 2000 American Institute of Physics.


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