Dielectric enhancement and Maxwell-Wagner effects in ferroelectric superlattice structures

O'Neill, D.; Bowman, R. M.; Bowman, R.M.; Gregg, J. M.; Gregg, J.M.
September 2000
Applied Physics Letters;9/4/2000, Vol. 77 Issue 10
Academic Journal
In an attempt to reproduce the functional properties associated with relaxor electroceramics, pulsed laser deposition has been used to fabricate thin-film capacitor structures in which the dielectric layer is composed of a superlattice of Ba[sub 0.8]Sr[sub 0.2]TiO[sub 3] and Ba[sub 0.2]Sr[sub 0.8]TiO[sub 3]. The properties of the capacitors were investigated as a function of superlattice periodicity. The dielectric constant was significantly enhanced at stacking periodicities of a few unit cells, consistent with relaxor behavior. However, enhancement in dielectric constant was generally associated with high dielectric loss. Analysis of the imaginary permittivity as a function of frequency shows that fine-scale superlattices conform to Maxwell-Wagner behavior. This suggests that the observed enhancement of the real part of the dielectric constant is an artifact produced by carrier migration to interfaces within the dielectric. A comparison of this data with that already published on dielectric superlattices suggests that previous claims of an enhancement in dielectric constant may also be attributed to the Maxwell-Wagner effect. © 2000 American Institute of Physics.


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