TITLE

Sensitivity of a micromechanical displacement detector based on the radio-frequency single-electron transistor

AUTHOR(S)
Blencowe, Miles P.; Wybourne, Martin N.; Wybourne, Martin N
PUB. DATE
December 2000
SOURCE
Applied Physics Letters;12/4/2000, Vol. 77 Issue 23
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the tunneling shot noise limits on the sensitivity of a micromechanical displacement detector based on a metal junction, radio-frequency single electron transistor (rf SET). Improvement of displacement sensitivities with the increasing gate voltage bias.
ACCESSION #
4413054

 

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