Combined dynamic adhesion and friction measurement with the scanning force microscope

Krotil, H.-U.; Stifter, Th.; Marti, O.
December 2000
Applied Physics Letters;12/4/2000, Vol. 77 Issue 23
Academic Journal
In this letter, we present a promising scanning probe microscopy mode, called combined dynamic X mode or short CODYMode®. In CODYMode® scanning force microscopy, at least two modulations with sufficiently different frequencies and amplitudes are superpositioned and interact with the sample surface. This enables the concurrent measurement of the topography, adhesive and frictional forces, and further mechanical surface properties of the sample. The general advantages of CODYMode® are discussed. This technique is predestined for investigation of delicate samples (polymers, biological samples, etc.) in which common scanning force microscope techniques are not adequate. An ABC-triblock copolymer system served as sample system. © 2000 American Institute of Physics.


Related Articles

  • Lock-in technique for concurrent measurement of adhesion and friction with the scanning force microscope. Krotil, H.-U.; Stifter, Th.; Marti, O. // Review of Scientific Instruments;Jan2001, Vol. 72 Issue 1, p150 

    Regardless of all the great progress in new scanning probe microscopy techniques, the concurrent measurement of adhesive and frictional forces with local resolution using scanning force microscopy (SFM) has not been possible until now. In this paper, we present a novel scanning probe microscopy...

  • Highly stable atom-tracking scanning tunneling microscopy. Rerkkumsup, Pongpun; Aketagawa, Masato; Takada, Koji; Togawa, Yoichi; Nguyen Tien Thinh, Yoichi; Kozuma, Yosuke // Review of Scientific Instruments;Apr2004, Vol. 75 Issue 4, p1061 

    In this article, we propose a technique for highly stabilized atom-tracking control of a scanning tunneling microscope (STM) tip by referring to an atomic point on a regular crystalline surface. Our aim is to prevent jumping of the STM tip to neighboring atoms and to use it even in a noisy...

  • Toward a Detailed Understanding of Si(111 )-7 X 7 Surface and Adsorbed Ge Nanostructures: Fabrications, Structures, and Calculations. Ye-Liang Wang; Hai-Ming Guo; Zhi-Hui Qin; Hai-Feng Ma; Hong-Jun Gao // Journal of Nanomaterials;2008 Special Issue 1, p1 

    Firstly, both the rest atoms and the adatoms of Si(111)-7×7 surface are observed simultaneously by scanning tunneling microscopy (STM) when the sample bias voltages are kept less than - 0.7V. The visibility of the rest atoms is rationalized by first-principle calculations and a very sharper...

  • Simultaneously measured signals in scanning probe microscopy with a needle sensor: Frequency shift and tunneling current. Morawski, Ireneusz; Voigtländer, Bert // Review of Scientific Instruments;Mar2010, Vol. 81 Issue 3, p033703 

    We present combined noncontact scanning force microscopy and tunneling current images of a platinum(111) surface obtained by means of a 1 MHz quartz needle sensor. The low-frequency circuit of the tunneling current was combined with a high-frequency signal of the quartz resonator enabling full...

  • Self-assembly of faceted Ni nanodots on Si(111). Aurongzeb, D.; Patibandla, S.; Holtz, M.; Temkin, H. // Applied Physics Letters;3/7/2005, Vol. 86 Issue 10, p103107 

    We report the formation of Ni nanodots on Si(111). Island density is varied by annealing temperature and time and is studied using atomic force microscopy (AFM) and magnetic force microscopy. Activation energies of 0.09±0.02 and 0.31±0.05 eV are observed for the formation of these islands....

  • Scanning probe microscopy on new dental alloys. Reusch, B.; Geis-Gerstorfer, J.; Ziegler, C. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 7, pS805 

    Abstract. Surface analytical methods such as scanning force microscopy (SFM), scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) were used to determine the surface properties of amalgam substitutes as tooth filling materials. In particular the corrosion and the...

  • Three-Dimensional Force Field Spectroscopy. Schwarz, Alexander; Holscher, Hendrick; Langkat, S. M.; Wiesendanger, R. // AIP Conference Proceedings;2003, Vol. 696 Issue 1, p68 

    A method is presented that utilizes the frequency modulation technique in ultra-high vacuum to measure the tip-sample force field in all three dimensions with atomic resolution. It is based on a systematic procedure to record frequency shift versus distance curves. After their conversion into...

  • Switchable cantilever for a time-of-flight scanning force microscope. DongWeon Lee, B.; Wetzel, Adrian; Bennewitz, Roland; Meyer, Ernst; Despont, Michel; Vettiger, Peter; Gerber, Christoph // Applied Physics Letters;3/1/2004, Vol. 84 Issue 9, p1558 

    We have developed a cantilever device for applying a time-of-flight scanning force microscope (TOF–SFM) system. The cantilever device consists of a switchable cantilever with an integrated bimorph actuator, an integrated extraction electrode to minimize the ion extraction voltage, and an...

  • Metal clusters on rare gas layers — growth and spectroscopy. Irawan, T.; Boecker, D.; Ghaleh, F.; Yin, C.; von Issendorff, B.; Hövel, H. // Applied Physics A: Materials Science & Processing;Jan2006, Vol. 82 Issue 1, p81 

    Gold and lead clusters were grown by the evaporation of metal atoms on rare gas layers on Au(111) and Pb(111). The growth was investigated with scanning tunneling microscopy (STM) and ultraviolet photoelectron spectroscopy (UPS). We studied the electronic coupling to the surface and charging...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics