Low-temperature Kerr spectroscopy on half-metallic Sr[sub 2]FeMoO[sub 6]

Ru¨diger, U.; Rabe, M.; Gu¨ntherodt, G.; Yin, H. Q.; Dass, R. I.; Goodenough, J. B.
October 2000
Applied Physics Letters;10/2/2000, Vol. 77 Issue 14
Academic Journal
The polar Kerr rotation and ellipticity spectra of epitaxially grown (001)-oriented half-metallic Sr[sub 2]FeMoO[sub 6] thin films have been determined in the photon energy range from 1.2 to 4.9 eV. The Kerr rotation spectrum shows three maxima at E=1.6, 4.0, and 4.65 eV. The maxima at 4.0 and 4.65 eV are consistent with spin-polarized band structure calculations for interband transitions from the O-2p to the minority-spin π*Mo/Fe and majority-spin Mo-t[sub 2g] bands, respectively. The overall maximum intrinsic Kerr rotation is Θ[sub K]=-0.045° at a photon energy of 4.65 eV. The maximum of Θ[sub K] at E=1.6 eV coincides with a minimum in the reflectivity due to the plasma edge of Sr[sub 2]FeMoO[sub 6] and, therefore, is not related to an interband transition. © 2000 American Institute of Physics.


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