Ultralow noise field-effect transistor from multilayer graphene

Pal, Atindra Nath; Ghosh, Arindam
August 2009
Applied Physics Letters;8/24/2009, Vol. 95 Issue 8, p082105
Academic Journal
We present low-frequency electrical resistance fluctuations, or noise, in graphene-based field-effect devices with varying number of layers. In single-layer devices, the noise magnitude decreases with increasing carrier density, which behaved oppositely in the devices with two or larger number of layers accompanied by a suppression in noise magnitude by more than two orders in the latter case. This behavior can be explained from the influence of external electric field on graphene band structure, and provides a simple transport-based route to isolate single-layer graphene devices from those with multiple layers.


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