Analysis of scanning tunneling microscopy feedback system: Experimental determination of parameters

Anguiano, E.; Olivia, A.I.; Aguilar, M.; Pena, J.L.
August 1996
Review of Scientific Instruments;Aug1996, Vol. 67 Issue 8, p2947
Academic Journal
Describes the experimental work necessary on a scanning tunneling microscopy (STM) system to obtain some important feedback parameters. Examination and analysis of the main components involved on the STM such as the feedback system and its relation with the scanning rate for imaging; Importance of obtaining these parameters with the STM in tunnel condition.


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