TITLE

Analysis of scanning tunneling microscopy feedback system: Experimental determination of parameters

AUTHOR(S)
Anguiano, E.; Olivia, A.I.; Aguilar, M.; Pena, J.L.
PUB. DATE
August 1996
SOURCE
Review of Scientific Instruments;Aug1996, Vol. 67 Issue 8, p2947
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes the experimental work necessary on a scanning tunneling microscopy (STM) system to obtain some important feedback parameters. Examination and analysis of the main components involved on the STM such as the feedback system and its relation with the scanning rate for imaging; Importance of obtaining these parameters with the STM in tunnel condition.
ACCESSION #
4376487

 

Related Articles

  • Analysis of scanning tunneling microscopy feedback system. Oliva, A.I.; Anguiano, E.; Denisenko, N.; Aguilar, M.; Pena, J.L. // Review of Scientific Instruments;May95, Vol. 66 Issue 5, p3196 

    Presents a theoretical analysis of the feedback system in the scanning tunneling microscope (STM). Inclusion of all elements involved in the STM loop in the proposed model; Control system description; Feedback model; Stability study and models for the z-piezo; Most common problems during the...

  • Optimal conditions for imaging in scanning tunneling microscopy: Theory Anguiano, E.; Oliva, A.I.; Aguilar, M. // Review of Scientific Instruments;Nov98, Vol. 69 Issue 11, p3867 

    Examines the optimal conditions for imaging the scanning tunneling microscopy (STM) feedback system. Importance of feedback circuit into the loop; Main parameters used to obtain STM images; Effects of combining the stability conditions with the optimal conditions.

  • Optimal conditions for imaging in scanning tunneling microscopy: Experimental Anguiano, E.; Oliva, A.I.; Aguilar, M. // Review of Scientific Instruments;Nov98, Vol. 69 Issue 11, p3875 

    Presents the study of the behavior of surface textures imaged by scanning tunneling microscopy (STM) under different control conditions in the feedback loop. Description of the quality and reliability of STM images; Analysis of the main surface texture parameters; Role of STM technique for...

  • New scanning device for scanning tunneling microscope applications. Koops, R.; Sawatzky, G. A. // Review of Scientific Instruments;Aug1992, Vol. 63 Issue 8, p4008 

    A small, single piezo XYZ translator has been developed. The device has been used as a scanner for a scanning tunneling microscope and has been tested successfully in air and in UHV. Its simple design results in a rigid and compact scanning unit which permits high scanning rates.

  • A digital integrator and scan generator coupled with dynamic scanning for scanning tunneling microscopy. Robinson, R. S.; Kimsey, T. H.; Kimsey, R. // Review of Scientific Instruments;Jul1991, Vol. 62 Issue 7, p1772 

    A novel digital integrator circuit has been engineered for constant-current mode STM feedback control. In contrast to analog integrators that rely on charging or discharging of a capacitor in an amplifier feedback loop, the integrator uses a 16-bit digital counter that is rapidly incremented or...

  • Digital feedback control loops for scanning tunneling microscopes. Morgan, B. A.; Stupian, G. W. // Review of Scientific Instruments;Dec1991, Vol. 62 Issue 12, p3112 

    Many circuit functions can now be realized using digital rather than analog techniques. The application of digital signal processing (DSP) technology for the implementation of the feedback control loop of a scanning tunneling microscope is discussed. A system that utilizes a commercially...

  • Theories of the feedback and vibration isolation systems for the scanning tunneling microscope. Park, Sang-il; Quate, C. F. // Review of Scientific Instruments;Nov87, Vol. 58 Issue 11, p2004 

    The theories of the feedback and vibration isolation systems have been developed to illuminate the essential points in the design and operation of the scanning tunneling microscope (STM). By analyzing a delay differential equation, we can understand the behavior of feedback and estimate the...

  • Single-tube three-dimensional scanner for scanning tunneling microscopy. Binnig, G.; Smith, D. P. E. // Review of Scientific Instruments;Aug1986, Vol. 57 Issue 8, p1688 

    We report a new type of three-dimensional mechanical scanner fabricated from a single piezoelectric tube. It has a typical response of 5 nm/V in each orthogonal direction and mechanical resonances at 8 kHz (bending perpendicular to the tube axis) and 40 kHz (motion parallel to the tube axis)....

  • Improved scanning tunneling microscope feedback for investigation of surfaces with micron-scale roughness. Scholl, D.; Everson, M. P.; Jaklevic, R. C.; Shen, Weidian // Review of Scientific Instruments;Sep92, Vol. 63 Issue 9, p4046 

    When scanning steeply sloped features which are near micron size or taller, scanning tunneling microscopes with conventional feedback control loops exhibit slower response on downhill slopes than on uphill slopes. This effect is caused by the exponential dependence of the tunneling current on...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics