Studies on quantitative x-ray diffraction characterization of phase depth profiles

Luo, Jian; Tao, Kun; Yin, Hong; Du, Yong
August 1996
Review of Scientific Instruments;Aug1996, Vol. 67 Issue 8, p2859
Academic Journal
Presents a fitting method using parallel beam x-ray diffraction (XRD) for profiling phase content changing with depth. Dependence of the method on measurements of XRD intensity at various incident angles; Application of the procedures to a nitrided steel sample without preferred orientation and a thin-film sample with preferred orientation.


Related Articles

  • Market Profile: X-Ray Diffraction (XRD).  // Spectroscopy;Feb2001, Vol. 16 Issue 2, p12 

    Describes the process of x-ray diffraction (XRD). Significance of XRD; Forecast on the demand for XRD-processed products.

  • Properties of curved x-ray diffractors with stepped surfaces. Wittry, D. B.; Sun, Songquan // Journal of Applied Physics;4/1/1991, Vol. 69 Issue 7, p3886 

    Discusses the problems in the practical fabrication of high-efficiency x-ray diffractors. Effect of rocking curve width on collection solid angle and resolution; Calculation procedure for a diffractor with stepped surface; Ways to deal with the fabrication problems.

  • X-ray diffraction of multilayers with a systematic deviation of period. Gao, Chen; Jiang, Zuimin; Wu, Zigin // Journal of Applied Physics;7/15/1990, Vol. 68 Issue 2, p874 

    Presents a study which examined the x-ray diffraction profile of multilayers with a systematic deviation of period. Prediction of the peak shift, asymmetric peak shape and decrease in peak shape; Comparison between the systematic deviation of period and the random fluctuation of period.

  • Focusing properties of curved x-ray diffractors. Wittry, D. B.; Sun, Songquan // Journal of Applied Physics;7/15/1990, Vol. 68 Issue 2, p387 

    Presents a study which calculated the focusing properties of curved x-ray diffractors for Bragg angles. Procedure; Results and discussion; Conclusion.

  • Short range order in AgI–AgPO3 glasses by x-ray diffraction. Musinu, A.; Piccaluga, G.; Pinna, G. // Journal of Chemical Physics;7/15/1988, Vol. 89 Issue 2, p1074 

    A structural investigation by x-ray diffraction is presented on ionic conducting glasses of composition (AgI)x (AgPO3)1-x, with x=0.0, x=0.45, and x=0.55. The radial distribution functions of the AgI-doped glasses, calculated from the experimental diffracted intensities, are dominated by a peak...

  • Optimal epilayer thickness for InxGa1-xAs and InyAl1-yAs composition measurement by high-resolution x-ray diffraction. Bennett, Brian R.; del Alamo, Jesús A. // Journal of Applied Physics;6/15/1993, Vol. 73 Issue 12, p8304 

    Presents a study on optimal epilayer thickness for In[subx]Ga[sub1-x] and In[suby]Al[sub1-y]As compostion measurement by high-resolution x-ray diffraction. Introduction to high-resolution x-ray diffraction; Experimental design; Results and discussion.

  • A method of rapidly obtaining concentration-depth profiles from x-ray diffraction. Wiedemann, K. E.; Unnam, J. // Journal of Applied Physics;8/1/1985, Vol. 58 Issue 3, p1095 

    Proposes a method which utilizes an easily evaluated analysis of x-ray diffraction peak. Removal of noncompositional broadening; Intensity band to composition-depth profile transformation; Example calculation of composition depths profile.

  • Layer thickness variations and x-ray diffraction patterns: A general treatment. Hollanders, Mark A.; Thijsse, Barend J. // Journal of Applied Physics;8/1/1991, Vol. 70 Issue 3, p1270 

    Presents a study that investigated layer thickness variations and x-ray diffraction patterns. Importance of compositionally modulated materials; Discussion of crystalline sublayers; Consideration of lateral thickness variations.

  • Bond orders from X-ray diffraction data.  // Chemistry in Australia;Sep2012, p12 

    The article reports that researchers have developed an approach wherein bond order data can be directly obtained from routine X-ray diffraction experiments.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics