TITLE

Studies on quantitative x-ray diffraction characterization of phase depth profiles

AUTHOR(S)
Luo, Jian; Tao, Kun; Yin, Hong; Du, Yong
PUB. DATE
August 1996
SOURCE
Review of Scientific Instruments;Aug1996, Vol. 67 Issue 8, p2859
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a fitting method using parallel beam x-ray diffraction (XRD) for profiling phase content changing with depth. Dependence of the method on measurements of XRD intensity at various incident angles; Application of the procedures to a nitrided steel sample without preferred orientation and a thin-film sample with preferred orientation.
ACCESSION #
4376471

 

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