TITLE

Interface effects on highly epitaxial ferroelectric thin films

AUTHOR(S)
Lin, Y.; Chen, C. L.
PUB. DATE
October 2009
SOURCE
Journal of Materials Science;Oct2009, Vol. 44 Issue 19, p5274
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Interface effects have been found to play a key role in controlling the epitaxial nature and physical properties on the highly epitaxial ferroelectric thin films. Thin film ferroelectrics are dominantly affected by the strains induced by lattice misfits between the films and the substrates, surface step terrace, both step height and terrace dimension, and the surface terminations. The natures of interface induced local strain formations, edge dislocations, and antiphase domain boundaries are reviewed in this article.
ACCESSION #
43757758

 

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