Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers

Malik, A.; Lin, W.; Durbin, M.K.; Marks, T.J.; Dutta, P.
July 1997
Journal of Chemical Physics;7/8/1997, Vol. 107 Issue 2, p645
Academic Journal
Reports on the use of specular x-ray reflectivity to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane self-assembly technique that is repeated to form periodic multilayers. Increase in the film thickness as a function of the number of trilayers; Bragg peaks corresponding to the inter-trilayer spacing.


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