TITLE

The origin of sample memory in the Chalk River accelerator mass spectrometry sputter ion source

AUTHOR(S)
Koslowsky, V.T.; Andrews, H.R.; Davies, W.G.; Forster, J.S.; Imahori, Y.
PUB. DATE
March 1996
SOURCE
Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1416
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Studies the origin of memory effects in the Chalk River accelerator mass spectrometry sputter ion source by tracer and elastic-recoil-detection surface analysis techniques. Surface distributions of sputtered material; Identification of forward-recoiling surface atoms Rutherford scattered by a heavy-ion beam; Modification to source design and effects.
ACCESSION #
4367334

 

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