TITLE

Profile measurements of high intensity-low energy ion beams

AUTHOR(S)
Rezzonico, L.; Olivo, M.
PUB. DATE
March 1996
SOURCE
Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1246
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Discusses results of the implementation of a noninterceptive beam profile monitor in the 60 and 870 keV high intensity direct current beam lines of the Paul Scherrer Institute accelerator complex in Switzerland. Space charge neutralization effects; Repetition rate of the pulsed beam; Average length of wire scanners.
ACCESSION #
4367274

 

Related Articles

  • Application of 6 MeV/n heavy-ion beams to biophysical experiments (abstract). Sato, Y.; Tanaka, A.; Furusawa, Y.; Matsumoto, S.; Murukami, K.; Soga, F.; Takeo, K.; Fujita, Y. // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1374 

    Discusses an abstract describing the application of 6 MeV/n heavy-ion beams to biophysical experiments. Production of beams at the terminal of the injector linac; Acceleration of various ion species having different charge states to the same velocity; Attempted investigation of track structure...

  • The electron-beam ion source 'Krion-S' performance in LHE (abstract). Ovsyannikov, V.P.; Kalagin, I.V.; Kovalenko, A.D.; Romanov, Yi. I.; Kultashev, O.K. // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1161 

    Discusses the abstract for the design of the electron-beam ion source Krion S on the high voltage platform of the preinjector of the LINAC LU-20. Acceleration of argon and krypton ions; Gas mixing procedure for 'ion cooling'.

  • Acceleration of high-current ion beams. Spadtke, P.; Emig, H.; Klabunde, J.; Mayr, R.; Ruck, D.M.; Tinschert, K. // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1146 

    Discusses the acceleration of high-current ion beams. Space charge compensation of the measured emittances of ion beams; Simulation of the influence of the space charge on the beam quality; Input energy of the radio frequency quadrupole.

  • Neutralization of space charge forces using ionized background gas. Steski, D.B.; Zarcone, M.J.; Smith, K.S.; Thieberger, P. // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1221 

    Examines the neutralization of space charge forces using ionized background gas. Time requirements for the various gases to neutralize the beam as a function of pressure; Transmission of integrated beam current from the upstream to the downstream cup as a function of gas pressure; Effectiveness...

  • Extraction studies on electron cyclotron resonance ion sources. Leroy, R.; Mandin, J.; Bertrand, P.; Lecesne, N.; Pacquet, J.Y.; Robert, E.; Sortais, P.; Villari, A.C.C. // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p1350 

    Compares the results of an ion beam extraction experiment using electron cyclotron resonance ion sources and numerical simulation. Influence of the axial magnetic field on multicharged ion beam if the space charge during the acceleration is not compensated; Effect of the decrease of the plasma...

  • Focused ion-beam direct deposition of metal thin film. Nagamachi, Shinji; Yamakage, Yasuhiro; Ueda, Masahiro; Maruno, Hiromasa; Ishikawa, Junzo // Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2351 

    Reports on the development of focused ion-beam direct deposition as a method for fabricating patterned metal films directly on substrates. Performance of ion-beam deposition by low-energy focused ion beams; Estimated beam diameter; Measurement of the purity of the gold film using Auger electron...

  • A beam line for highly charged ions. Pikin, A.I.; Morgan, C.A.; Bell, E.W.; Ratliff, L.P.; Church, D.A.; Gillaspy, J.D. // Review of Scientific Instruments;Jul96, Vol. 67 Issue 7, p2528 

    Describes the design and operation of a beam line for transporting and charge-to-mass selecting highly charged ions extracted from the National Institute of Standards and Technology electron beam ion trap (EBIT). Production of pure beams of low-energy, highly charged ions; Design choices and...

  • An apparatus for glancing incidence ion beam polishing and characterization of surfaces to... Wissing, M.; Holzwarth, M.; Simeonova, D.S.; Snowdon, K.J. // Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4314 

    Describes an instrument which combines a glancing incidence ion beam erosion system with a scanning tunneling and an atomic force microscope. Allowing the ion beam polishing and surface topographic characterization of samples under ultrahigh vacuum conditions; Vacuum system and vibration...

  • Accelerator for ion beams using triangle-shaped accelerated waves. Kawaguchi, M.; Sasahara, M.; Noritake, T.; Enjoji, H. // Review of Scientific Instruments;Dec1986, Vol. 57 Issue 12, p2935 

    An accelerator for ion beams has been designed and constructed in which ions collectively undergo acceleration in the wells of a train of triangle-shaped potential waves moving with a constant acceleration. The accelerator mentioned above is planned for investigating the conditions necessary for...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics