Wave form analysis of constant capacitance-voltage transient deep level transient spectroscopy

Okamoto, Y.; Yonekura, H.; Morimoto, J.; Miyakawa, T.
March 1996
Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p809
Academic Journal
Proposes a version of the constant capacitance-voltage transient (CCVT) method to study the emission rate spectrum of deep impurity levels in semiconductors. Use of nonlinear least-squares program to analyze emission rate spectrum; Feasibility of the method for a gold-doped silicon diode.


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