X-ray laser radiography of perturbations due to imprint of laser speckle in 0.35 mum laser

Kalantar, D.H.; Barbee, T.W.; DaSilva, L.B.; Glendinning, S.G.; Weber, F.; Weber, S.V.; Key, M.H.; Knauer, J.P.
March 1996
Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p781
Academic Journal
Reports on the development of a technique to measure the optical depth modulations in a thin silicon foil by face-on radiography. Probing of sample with high opacity using high brightness of the Ne-like x-ray laser; Sensitivity of the brightness and long wavelength of the x-ray laser; Calculated ratio of transmission of the silicon in and out of the grooves.


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