Medium and high energy x-ray instrument for sample characterization

Petrillo, C.; Rocchi, C.; Sacchetti, F.
March 1996
Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p693
Academic Journal
Describes the use of a medium to high energy x-ray instrument which can be operated either by selecting the W K[sub alpha] or exploiting the white spectrum for sample characterization. Apparatus layout; Use of thick crystalline samples of Ge; Diffraction pattern; Rocking curve of the reflection.


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