TITLE

Low thermal power electron beam annealing of scanning tunneling microscope tips

AUTHOR(S)
Scholz, R.; Agne, M.; Breitenstein, O.; Jenniches, H.
PUB. DATE
August 1997
SOURCE
Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3262
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes the development of an add-on unit that allows the cleaning of scanning tunneling microscope tips by electron beam annealing even if they cannot be disconnected from the piezo scanner in situ. Pulsed annealing treatment of the whole scanner tip combination; Focus on the heat impact on the outermost tip.
ACCESSION #
4358646

 

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