A high-resolution scanning Kelvin probe microscope for contact potential measurements on the 100

Nabhan, W.; Equer, B.; Broniatowski, A.; De Rosny, G.
August 1997
Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3108
Academic Journal
Describes the principles and performance of a scanning Kelvin probe microscope for contact potential measurements with a lateral resolution on the 100 nanometer scale and a sensitivity in the millivolt range. Design and manufacture of guarded microelectrodes; Probe system and control circuitry; Surface potential fluctuations associated with charged grain boundaries.


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