Enhanced local surface conductivity measurements by scanning tunneling microscopy

Muller, F.; Muller, A.-D.; Meissner, O.; Helimann, A.; Hietschold, M.
August 1997
Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3104
Academic Journal
Describes a scanning tunneling microscope with complete digital control and capable of determining the local reactance of the surface by using a mathematical procedure. Measurement of surface properties; Topography image produced; Detection of conductivity and capacitance differences.


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