An improved lamellae drop-off technique for sharp tip preparation in scanning tunneling microscopy

Klein, M.; Schwitzgebel, G.
August 1997
Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3099
Academic Journal
Describes a superior lamellae etching drop-off technique for the preparation of W tips in scanning tunneling microscopy without the use of carbon tetrachloride. Preparation of the tungsten tips; Electrochemical etching of platinum/iridium alloy tips; Effectiveness of the technique.


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