Thermal imaging with near-field microscopy

Boudreau, B.D.; Raja, J.; Hocken, R.J.; Patterson, S.R.; Patten, J.
August 1997
Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3096
Academic Journal
Describes thermal imaging with near-field microscopy. Use of a subwavelength aperture to circumvent resolution limitation in obtaining images with enhanced resolution; Capability of imaging the thermal emissions from micron scale conductors using optical techniques; Design of the microscope.


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