A share force feedback control system for near-field scanning optical microscopes without lock-in

Hsu, J.W.P.; McDaniel, A.A.; Hallen, H.D.
August 1997
Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3093
Academic Journal
Describes the improvement to the alternating current impedance detection method for tip-sample distance control in near-field scanning optical microscopes. Increase in the output signal of the electronic bridge; Signal-to-noise ratio detection; Compactness and inexpensiveness of the electronics for the shear force feedback.


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