Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm

Jun Shao; Lu Chen; Xiang Lü; Wei Lu; Li He; Shaoling Guo; Junhao Chu
July 2009
Applied Physics Letters;7/27/2009, Vol. 95 Issue 4, p041908
Academic Journal
The application of photoreflectance (PR) spectroscopy had been for long time restricted to short-wavelength spectral region and was recently pushed to long wave infrared about 9 μm. In this letter, PR measurement in the very-long wave infrared of up to 20 μm is demonstrated by a step-scan Fourier transform infrared spectrometer-based technique. An arsenic-doped narrow-gap HgCdTe epilayer is measured at 77 K, the resultant infrared PR spectrum is analyzed by line shape function, and donor and acceptor levels are discussed with aid of photoluminescence measurement at nominally identical temperature. The results suggest promising application of PR spectroscopy in the very-long wave infrared spectral region.


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