Probing microwave capacitance of self-assembled quantum dots

Guanglei Cheng; Levy, Jeremy; Medeiros-Ribeiro, Gilberto
July 2009
Applied Physics Letters;7/20/2009, Vol. 95 Issue 3, p032103
Academic Journal
Self-assembled quantum dots have remarkable optical, electronic, and spintronic properties that make them leading candidates for quantum information technologies. Their characterization requires rapid and local determination of both charge and spin degrees of freedom. We present a way to probe the capacitance of small ensembles of quantum dots at microwave frequencies. The technique employs a capacitance sensor based on a microwave microstrip resonator with sensitivity [formula], high enough to probe single electrons. The integration of this design in a scanning microscope will provide an important tool for investigating single charge and spin dynamics in self-assembled quantum dot systems.


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