TITLE

Edge effects and a method of defect sizing for transient thermography

AUTHOR(S)
Almond, D.P.; Lau, S.K.
PUB. DATE
June 1993
SOURCE
Applied Physics Letters;6/21/1993, Vol. 62 Issue 25, p3369
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines edge effects and a method for defect sizing for transient thermography. Impact of defects or subsurface structures on heat flow; Influence of edge effect on size reduction; Dependence of edge effects on thermal diffusivity.
ACCESSION #
4338094

 

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