Absolute magnetic penetration depth of thin-film niobium measured by fluxoid quantization

Cunningham, C.E.; Park, G.S.; Cabrera, B.; Huber, M.E.
April 1993
Applied Physics Letters;4/26/1993, Vol. 62 Issue 17, p2122
Academic Journal
Investigates the measurement of absolute magnetic penetration depth of thin film niobium through fluxoid quantization. Determination of the total inductance of the loop; Use of Bardeen-Cooper-Schrieffer theory to determine the inductances; Relation between the kinetic inductance and penetration depth.


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