Soft x-ray emission spectrometer for undulator radiation

Shin, S.; Agui, A.; Fujisawa, M.; Tezuka, Y.; Ishii, T.; Hirai, N.
February 1995
Review of Scientific Instruments;Feb1995, Vol. 66 Issue 2, p1584
Academic Journal
Describes an experimental system for high-resolution soft x-ray emission spectroscopy that was designed to be attached to the undulator beamlines. Geometry of the spectrometer; Focusing properties; Resolution obtained by the system.


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