High resolution x-ray diffraction of periodic surface gratings

van der Sluis, P.; Binsma, J.J.M.; van Dongen, T.
June 1993
Applied Physics Letters;6/14/1993, Vol. 62 Issue 24, p3186
Academic Journal
Demonstrates high resolution x-ray diffraction of periodic surface gratings. Approximation of optimal geometry by 113 reflection measurement; Influence of reflection asymmetry on beam compression; Use of Ewald sphere section to depict low angular detector resolution.


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