Effect of carrier escape time on the performance of semi-insulating photorefractive

Partovi, A.; Glass, A.M.; Zydzik, G.J.; O'Bryan, H.M.; Chiu, T.H.; Knox, W.H.
June 1993
Applied Physics Letters;6/14/1993, Vol. 62 Issue 24, p3088
Academic Journal
Investigates the effect of carrier escape time on the performance of semi-insulating photorefractive self-electro-optic effect devices. Use of chromium-doped multiple quantum wells; Reduction in barrier thickness; Effect of the shorter carrier escape on the diffraction efficiency.


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