TITLE

Direct determination of the ambipolar diffusion length in strained In[sub x]Ga[sub 1-x]As/InP

AUTHOR(S)
Lee, Robert B.; Vahala, Kerry J.; Chung-En Zah; Bhat, Rajaram
PUB. DATE
May 1993
SOURCE
Applied Physics Letters;5/10/1993, Vol. 62 Issue 19, p2411
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Determines the ambipolar diffusion length in strained In[sub x]Ga[sub 1-x]As/InP quantum wells. Use of cathodoluminescence in a scanning electron microscopy; Increase in ambipolar diffusion length in lower indium mole fraction sample; Consistency of the result with experimental carrier lifetime measurement.
ACCESSION #
4329714

 

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