TITLE

Optical characterization of pure ZnSe films grown on GaAs

AUTHOR(S)
Young-Dong Kim; Cooper, S.L.; Klein, M.V.; Jonker, B.T.
PUB. DATE
May 1993
SOURCE
Applied Physics Letters;5/10/1993, Vol. 62 Issue 19, p2387
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Measures the dielectric function of a zinc selenide film grown gallium arsenide substrate using spectroscopic ellipsometry. Growth of the sample by molecular beam epitaxy; Removal of a natural surface oxide overlayer on ZnSe; Application of chemical etching procedure.
ACCESSION #
4329706

 

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