Photoconductive sampling probe with 2.3-ps temporal resolution and 4-muV sensitivity

Joungho Kim; Williamson, Steven; Nees, John; Wakana, Shin-ichi; Whitaker, John
May 1993
Applied Physics Letters;5/3/1993, Vol. 62 Issue 18, p2268
Academic Journal
Evaluates the application of a novel probe technology to measure the high-speed guided electrical signals. Components of the probe; Determination of the dynamic range of the probe; Suitability of probe for noninvasive, external circuit testing of ultrahigh-speed devices.


Related Articles

  • A circuit and five probe resistivity method for measuring pulse I–V characteristics of superconductors. Gupta, S. K.; Gadkari, S. C.; Aswal, D. K.; Gupta, M. K. // Review of Scientific Instruments;Jun94, Vol. 65 Issue 6, p2065 

    An electronic circuit has been developed to study the pulse I-V characteristics of superconductors. A special feature of the circuit is its low rms_noise voltage of less than 10 nV, which allows measurements over a broad voltage range of 50 nV to 500 mV for the first time. In order to overcome...

  • Connectorless logic-analyzer probes reduce capacitive load by 80%. Strassberg, Dan // EDN;6/26/2003, Vol. 48 Issue 14, p17 

    Agilent Technologies' E5394A soft-touch probe minimizes its effect on system performance by connecting to target personal computer boards without passing the signals through a conventional adapter. Compared with other connectorless probes, the design reduces capacitive loading by 80 per cent and...

  • USING A MULTIMETER. Tuzson, Paul // Street Machine;Feb2006, Vol. 26 Issue 2, p125 

    The article explains how to use a multimeter, a tool for sorting out the electrical system of a car. It offers information on the two types of multimeter. It also presents information on the multimeter's probes which are connected in parallel with the component being tested. The red probe...

  • A novel probe design for pulsed nitrogen-14 nuclear quadrupole resonance spectrometer. Geng-Ying Li; Xiao-Jian Xia; Hai-Bin Xie; Yi Liu // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p704 

    Proposes a fast recovery probe circuit for pulsed nitrogen-14 nuclear quadrupole resonance spectrometer. Circuit design; Experiment demonstrating the efficiency of the circuit.

  • Eye of the probe. Johnson, Howard // EDN;12/1/2006, Vol. 51 Issue 25, p30 

    The article deals with a differential probe which touches two surface-level signal traces. The said signal traces are directly adjacent to the input balls of a 2.5-Gbps digital deserializer in a large Ball Grid Array package. It should be noted that the signal arrives from an...

  • Simplifying the Search for Unwanted Ground Current. Shaughnessy, Tom // EC&M Electrical Construction & Maintenance;Apr2008, Vol. 107 Issue 4, p18 

    The article discusses the search for unwanted ground current. It states that the efforts to find and correct ground current problems are driven by ground fault detect circuit breakers. It says that the unwanted ground current can be traced using flexible current probes and current transformers...

  • ECT's Fixtureless PCB Tester.  // Circuits Assembly;Mar2006, Vol. 17 Issue 3, p61 

    The article focuses on the fixtureless printed circuit board tester from ECT Inc. Eliminator 6 is a fixtureless tester for PCB panels. It can be used for electrical test of rigid PCBs and PCB innerlayers. Designed for panel test, the system makes direct current measurements and requires no...

  • Low Capacitance Electrical Probe for Nanoscale Devices and Circuits. Forbes, Leonard; Miller, Drake A.; Jacob, Michael E. // Open Nanoscience Journal;2008, Vol. 2, p39 

    An electrical probe is constructed of a small capacitor in contact with the circuit node under test so as not to load this circuit node and cause distortion of the input signal. The small capacitor is then placed in series with the small input resistance of a terminated coaxial signal line. The...

  • Simple and efficient method for carbon nanotube attachment to scanning probes and other substrates. Hall, A.; Matthews, W. G.; Superfine, R.; Falvo, M. R.; Washburn, S. // Applied Physics Letters;4/14/2003, Vol. 82 Issue 15, p2506 

    We present a fast, high yield, low cost method for the production of scanning probes with aligned carbon nanotubes protruding from the ends. The procedure is described and images of undercut films are used to demonstrate the improved probe quality for topography measurements. A magnetophoretic...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics