TITLE

Photoconductive sampling probe with 2.3-ps temporal resolution and 4-muV sensitivity

AUTHOR(S)
Joungho Kim; Williamson, Steven; Nees, John; Wakana, Shin-ichi; Whitaker, John
PUB. DATE
May 1993
SOURCE
Applied Physics Letters;5/3/1993, Vol. 62 Issue 18, p2268
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Evaluates the application of a novel probe technology to measure the high-speed guided electrical signals. Components of the probe; Determination of the dynamic range of the probe; Suitability of probe for noninvasive, external circuit testing of ultrahigh-speed devices.
ACCESSION #
4329667

 

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