Effect of electron heating on electron capture cross section in very small

Shi, Z.M.; Mieville, J.-P.; Dutoit, M.
May 1993
Applied Physics Letters;5/3/1993, Vol. 62 Issue 18, p2233
Academic Journal
Investigates the effect of electron heating on random telegraph signals in very small metal-oxide-semiconductor field effect transistors. Dependence of mean capture time on the local velocity and temperature of channel electrons; Estimation of the trap location along the channel; Difference between forward and backward mode.


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