TITLE

Near-field optical microscope using a silicon-nitride probe

AUTHOR(S)
van Hulst, N.F.; Moers, M.H.P.; Noordman, O.F.J.; Tack, R.G.; Segerink, F.B.; Bolger, B.
PUB. DATE
February 1993
SOURCE
Applied Physics Letters;2/1/1993, Vol. 62 Issue 5, p461
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes the operation of an alternative scanning near-field optical microscope. Use of microfabricated silicon-nitride probe with integrated cantilever for optical microscopy; Effect of adhesion forces on coupling to the evanescent wave; Comparison of optical images obtained by using SiN force probe with atomic force images.
ACCESSION #
4329517

 

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