Correlation of high temperature x-ray photoemission valence band spectra and conductivity in strained LaSrFeNi oxide on SrTiO3(110)

Braun, A.; Zhang, X.; Sun, Y.; Müller, U.; Liu, Z.; Erat, S.; Ari, M.; Grimmer, H.; Mao, S. S.; Graule, T.
July 2009
Applied Physics Letters;7/13/2009, Vol. 95 Issue 2, p022107
Academic Journal
Reversible and irreversible discontinuities at around 573 and 823 K in the electric conductivity of a strained 175 nm thin film of (La0.8Sr0.2)0.95Ni0.2Fe0.8O3-δ grown by pulsed laser deposition on SrTiO3 (110) are reflected by valence band changes as monitored in photoemission and oxygen K-edge x-ray absorption spectra (XAS). The irreversible jump at 823 K is attributed to depletion of doped electron holes concomitant with reduction of Fe3+ toward Fe2+, as evidenced by oxygen and iron core level soft XAS, and possibly of a chemical origin, whereas the reversible jump at 573 K possibly originates from structural changes.


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