TITLE

Atom probe compositional analysis of Co-Cr sputtered magnetic thin films

AUTHOR(S)
Hono, K.; Babu, S.S.; Maeda, Y.; Hasegawa, N.; Sakurai, T.
PUB. DATE
May 1993
SOURCE
Applied Physics Letters;5/17/1993, Vol. 62 Issue 20, p2504
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Analyzes the magnetic thin film sputter deposited on a heated copper coated silicon substrate in Co-Cr thin films. Composition of the films; Presence of compositional fluctuations in sputtered cobalt-chromium thin films; Observation of field ion microscopy images.
ACCESSION #
4323181

 

Related Articles

  • Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures. Larson, D. J.; Petford-Long, A. K.; Cerezo, A.; Smith, G. D. W.; Foord, D. T.; Anthony, T. C. // Applied Physics Letters;8/24/1998, Vol. 73 Issue 8 

    Focused ion-beam milling has been used to fabricate field-ion specimens from a multilayer film structure containing 100 repetitions of a (Cu[sub 2 nm]/Co[sub 2 nm]) bilayer deposited directly onto a planar substrate. The as-deposited films showed a magnetoresistance ratio of...

  • Magnetic cluster and medium noise in CoCrTa/Cr longitudinal film media studied by magnetic force... Chen, J.; Saito, H. // Journal of Applied Physics;1/15/1999, Vol. 85 Issue 2, p1037 

    Presents information on a study which investigated the magnetic cluster and medium noise in CoCrTa/Cr longitudinal film media using magnetic force microscopy. Experimental details; Experimental results and discussion; Conclusions.

  • Field-ion microscope analysis of the action of laser pulses on the surface of YBa[sub 2]Cu[sub 3]O[sub 7-y] single crystals. Kuzyakhmetov, G. G.; Bobkov, A. F.; Suvorov, A. L.; Cheblukov, Yu. N.; Balabaev, A. N.; Fedotov, A. S. // Technical Physics Letters;Jan98, Vol. 24 Issue 1, p30 

    Field-ion microscopy is used to investigate the interaction between electromagnetic radiation and the surface of YBa[sub 2]Cu[sub 3]O[sub 7-y] single crystals. It is shown that this action leads to the formation of a thin molten film on the surface of the sample, followed by the appearance of...

  • Evidence of local and global scaling regimes in thin films deposited by sputtering: An atomic force microscopy and electrochemical study. Souza Cruz, Tersio G.; Kleinke, M. U.; Gorenstein, A. // Applied Physics Letters;12/23/2002, Vol. 81 Issue 26, p4922 

    The surface morphology of NiO[sub x] thin films deposited by rf sputtering was studied by atomic force microscopy and by cyclic voltammetry. Linear relationships were observed in log-log plots of the interface width versus window length and in log-log plots of the peak current versus scan rate....

  • Electrical and optical properties of sputtered TiNx films as a function of substrate deposition temperature. Thorpe, T. P.; Qadri, S. B.; Wolf, S. A.; Claassen, J. H. // Applied Physics Letters;11/10/1986, Vol. 49 Issue 19, p1239 

    Characterization results are given for a set of TiNx films grown on sapphire substrates at temperatures between 140 and 850 °C. A relationship between resistivity and spectral reflectivity is established, with highest reflectivities and lowest resistivities observed for the highest substrate...

  • Sputter deposition of YBa2Cu3O7-y thin films. Silver, R. M.; Talvacchio, J.; de Lozanne, A. L. // Applied Physics Letters;12/21/1987, Vol. 51 Issue 25, p2149 

    Thin films of YBa2Cu3O7-y were prepared by magnetron sputtering. The films were characterized by x-ray diffraction, in situ x-ray photoelectron spectroscopy to determine the as-deposited oxygen content for various substrate temperatures, and scanning electron microscopy to analyze the...

  • Photoconductivity of CuInSe[sub 2] films. Rud�, V. Yu.; Rud�, Yu. V. // Semiconductors;Nov97, Vol. 31 Issue 11, p1151 

    CulnSe[sub 2] thin films were grown by vacuum sputtering of presynthesized material from a single source. The room-temperature photoconductivity spectra of the films were obtained. It was determined that the photoconductivity of these films depends strongly on the preparation conditions and,...

  • Origin of compositional variations in sputter-deposited Ti[sub x]W[sub 1-x] diffusion barrier.... Bergstrom, D.B.; Tian, F. // Applied Physics Letters;11/20/1995, Vol. 67 Issue 21, p3102 

    Investigates the origin of compositional variations in sputter-deposited Ti[sub x]W[sub 1-x] diffusion barrier layers. Utilization of Rutherford backscattering in determining the films deposited in argon; Use of TRIM calculations and Monte Carlo gas-transport simulations in the study; Reduction...

  • Crystallinity of a-axis oriented YBa[sub 2]Cu[sub 3]O[sub 7-delta] thin film epitaxially grown.... Homma, N.; Okayama, S.; Takahashi, H.; Yoshida, I.; Morishita, T.; Tanaka, S.; Haga, T.; Yamaya, K. // Applied Physics Letters;9/9/1991, Vol. 59 Issue 11, p1383 

    Examines the epitaxial deposition of an a-axis oriented YBa[sub 2]Cu[sub 3]O[sub 7-delta] thin film on NdGaO[sub 3] (110) by 95 MHz magnetron sputtering. Result of an excitation frequency of 94.92 MHz; Observation of sharp streaks corresponding to the c-axis lattice parameter.

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics