Thermal imaging using the atomic force microscope

Majumdar, A.; Carrejo, J.P.; Lai, J.
May 1993
Applied Physics Letters;5/17/1993, Vol. 62 Issue 20, p2501
Academic Journal
Develops a technique for thermal imaging with submicrometer spatial resolution using the atomic force microscope. Simultaneous thermal and topographical imaging of biased electronic devices and interconnects; Detection of the deflection of the cantilever due to the tip-substrated interatomic forces.


Related Articles

  • Atomic force microscopic study of rubbed polyimide films. Yang-Ming Zhu; Lin Wang // Applied Physics Letters;7/4/1994, Vol. 65 Issue 1, p49 

    Examines rubbed polyimide films using atomic force microscopy from micrometer to nanometer scales. Production of scratches on the polymer films surface; Alignment of liquid crystals in the films; Morphology of the surface property of rubbed polyimide films.

  • Improved atomic force microscope images using microcantilevers with sharp tips. Akamine, S.; Barrett, R. C.; Quate, C. F. // Applied Physics Letters;7/16/1990, Vol. 57 Issue 3, p316 

    Novel force-sensing microcantilevers with sharp tips have been used to obtain atomic force microscope images of atomically flat, layered compounds as well as microfabricated samples with large-scale topographies. When imaging atomically flat samples using cantilevers with sharp protruding tips,...

  • Atomic resolution imaging of a nonconductor by atomic force microscopy. Albrecht, T. R.; Quate, C. F. // Journal of Applied Physics;10/1/1987, Vol. 62 Issue 7, p2599 

    Presents a study that examined the capability of the atomic force microscope in imaging the surface of an electrically insulating solid with atomic resolution. Background on atomic force microscopy; Analysis of the lever-sample interaction; Results and implications.

  • High-speed atomic force microscopy in liquid. Sulchek, T.; Hsieh, R.; Adams, J. D.; Adams, J.D.; Minne, S. C.; Minne, S.C.; Quate, C. F.; Quate, C.F.; Adderton, D. M.; Adderton, D.M. // Review of Scientific Instruments;May2000, Vol. 71 Issue 5 

    High-speed constant force imaging with the atomic force microscope (AFM) has been achieved in liquid. By using a standard optical lever AFM, and a cantilever with an integrated zinc oxide (ZnO) piezoelectric actuator, an imaging bandwidth of 38 kHz has been achieved; nearly 100 times faster than...

  • Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes. Stark, Robert W.; Drobek, Tanja // Applied Physics Letters;5/31/1999, Vol. 74 Issue 22, p3296 

    Explores the use of tapping-mode atomic force microscopy to study soft biological samples. Sensitivity of the tapping probe; Effects of higher eigenmodes of the vibrating cantilever; Suitability for imaging applications.

  • High-speed tapping mode imaging with active Q control for atomic force microscopy. Sulchek, T.; T. Sulchek; Hsieh, R.; Adams, J. D.; Adams, J.D.; Yaralioglu, G. G.; Yaralioglu, G.G.; Minne, S. C.; Minne, S.C.; Quate, C. F.; Quate, C.F.; Cleveland, J. P.; Cleveland, J.P.; Atalar, A.; Adderton, D. M.; Adderton, D.M. // Applied Physics Letters;3/13/2000, Vol. 76 Issue 11 

    The speed of tapping mode imaging with the atomic force microscope (AFM) has been increased by over an order of magnitude. The enhanced operation is achieved by (1) increasing the instrument's mechanical bandwidth and (2) actively controlling the cantilever's dynamics. The instrument's...

  • Nanoscale mechanical behavior of individual semiconducting nanobelts. Mao, Scott X.; Zhao, Minhua; Wang, Zhong Lin // Applied Physics Letters;8/4/2003, Vol. 83 Issue 5, p993 

    Nanobelts are a group of materials that have a rectangle-like cross section with typical widths of several hundred nanometers, width-to-thickness ratios of 5-10, and lengths of hundreds of micrometers. In this letter, nanoindentations were made in individual ZnO and SnO[SUB2] nanobelts by a cube...

  • Ac-mode atomic force microscope imaging in air and solutions with a thermally driven bimetallic... Hillier, Andrew C.; Bard, Allen J. // Review of Scientific Instruments;May97, Vol. 68 Issue 5, p2082 

    Describes the development of an alternating current imaging mode for atomic force microscopy that employs a thermally driven bimetallic cantilever to sense surface topography. Variety of substrates used for imaging; Thermal response of the bimetallic cantilever; Response of the cantilever to...

  • Direct observation of the tip shape in scanning probe microscopy. Montelius, L.; Tegenfeldt, J.O. // Applied Physics Letters;5/24/1993, Vol. 62 Issue 21, p2628 

    Examines the shape of the atomic force microscopy (AFM) tip. Dependence of microscopy forces on the actual tip size; Comparison of the AFM image cantilever shape with the actual shape; Interaction between the tip material and biomolecules; Possibility of reverse imaging of objects positioned on...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics